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First 5020 results for ” A.C.A.P. van Lammeren and A.J. Feijt”

1. Interpreting extreme climate impacts from large ensemble simulations—are they unseen or unrealistic?

   Large-ensemble climate model simulations can provide deeper understanding of the characteristics ...

   T Kelder, N Wanders, K van der Wiel, TI Marjoribanks, LJ Slater, RI Wilby, C Prudhomme | Journal: Environmental Research Letters | Volume: 17 | Year: 2022 | First page: 044052 | doi: 10.1088/1748-9326/ac5cf4

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2. Measurement and interpolation uncertainties in rainfall maps from cellular communication networks

   Accurate measurements of rainfall are important in many hydrological and meteorological applicati...

   MF Rios Gaona, A Overeem, H Leijnse, R Uijlenhoet | Status: published | Journal: Hydrology and Earth System Sciences | Volume: 19 | Year: 2015 | First page: 3571 | Last page: 3584 | doi: 10.5194/hess-19-3571-2015

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3. First-year evaluation of GPM rainfall over the Netherlands: IMERG Day 1 Final Run (V03D)

   The Global Precipitation Measurement (GPM) mission is the successor to the Tropical Rainfall Meas...

   MF Rios Gaona, A Overeem, H Leijnse, R Uijlenhoet | Status: published | Journal: J. Hydrometeor. | Volume: 17 | Year: 2016 | First page: 2799 | Last page: 2814 | doi: 10.1175/JHM-D-16-0087.1

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4. Rainfall nowcasting using commercial microwave links

   Accurate and timely precipitation forecasts are crucial for early warning. Rainfall nowcasting, t...

   RO Imhoff, A Overeem, CC Brauer, H Leijnse, AH Weerts, R Uijlenhoet | Status: published | Journal: Geophys. Res. Lett. | Volume: 47 | Year: 2020 | doi: 10.1029/2020GL089365

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5. Rainfall-induced attenuation correction for two operational dual-polarization C-band radars in the Netherlands

   The Royal Netherlands Meteorological Institute (KNMI) operates two operational dual-polarization ...

   A Overeem, H de Vries, H Al Sakka, R Uijlenhoet, H Leijnse | Status: published | Journal: J. Atm. Oceanic Technol. | Volume: 38 | Year: 2021 | First page: 1125 | Last page: 1142 | doi: 10.1175/JTECH-D-20-0113.1

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