Search results

First 1036 results for ”KM Rider”

1. A perfect model study on the reliability of the added small-scale information in regional climate change projections

   he issue of the added value (AV) of high resolution regional climate models is complex and still ...

   Lenderink, Geert, de Vries, Hylke, van Meijgaard, Erik, van der Wiel, Karin and Selten, Frank | Journal: Climate Dynamics | Volume: 60 | Year: 2023 | First page: 2563 | Last page: 2579 | doi: 10.1007/s00382-022-06451-6

   Publication

2. Increased wheat price spikes and larger economic inequality with 2°C global warming.

   Climate change poses complex impacts on the global wheat supply and demand chain. The impacts of ...

   T Zhang, K van der Wiel, T Wei, J Screen, X Yue, B Zheng, F Selten, R Bintanja, W Anderson, R Blackport, S Glomsrod, Y Liu, X Cui, X Yang | Journal: One Earth | Volume: 5 | Year: 2022 | First page: 907 | Last page: 916 | doi: 10.1016/j.oneear.2022.07.004

   Publication

3. Extreme klimaatverandering en waterveiligheid in Nederland

   Dit document is een KNMI-bijdrage aan het project Aandacht Voor Veiligheid (AVV). Het beschrijft ...

   J Bessembinder, C Katsman, W Hazeleger, S Drijfhout, H van den Brink, G Lenderink, E van Meijgaard, M de Wit, H Buiteveld, W van Deursen | Year: 2008 | Pages: 35

   Publication

4. Compound flood impacts from Hurricane Sandy on New York City in climate-driven storylines

   High impact events like Hurricane Sandy (2012) significantly affect society and decision-making a...

   HMD Goulart, IB Lazaro, L van Garderen, K van der Wiel, D Le Bars, E Koks, B van den Hurk | Journal: Natural Hazards and Earth System Sciences | Volume: 24 | Year: 2024 | First page: 29 | Last page: 45 | doi: 10.5194/nhess-24-29-2024

   Publication

5. Validation of Backscatter Measurements from the Advanced Scatterometer on MetOp-A
   C Anderson, J Figa, H Bonekamp, J Wilson, J Verspeek, A Stoffelen, M Portabella | Status: published | Journal: J. Atm. Oceanic Technol. | Volume: 29 | Year: 2012 | First page: 77 | Last page: 88 | doi: 10.1175/JTECH-D-11-00020.1

   Publication