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Effects of correcting salinity with altimeter measurements in an equatorial Pacific ocean model
In this paper, we study the consequences of making salinity corrections in a tropical Pacific oce...
FC Vossepoel, G Burgers, PJ van Leeuwen | Status: published | Journal: J. Geophys. Res. | Volume: 107 | Year: 2002 | First page: 8001 | Last page: 8014 | doi: 10.1029/2001JC000816
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Impact of model resolution on tropical cyclone simulation using the HighResMIP-PRIMAVERA multimodel ensemble
A multimodel, multiresolution set of simulations over the period 1950–2014 using a common forcing...
MJ Roberts, J Camp, J Seddon, PL Vidale, K Hodges, B Vanniere, J Mecking, RJ Haarsma, A Bellucci, E Scoccimarro, LP Caron, F Chauvin, L Terray, S Valcke, MP Moine | Status: published | Journal: J. Climate | Year: 2020 | doi: 10.1175/JCLI-D-19-0639.1
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Spatial and temporal evaluation of radar rainfall nowcasting techniques on 1,533 events
Radar rainfall nowcasting, the process of statistically extrapolating the most recent rainfall ob...
RO Imhoff, CC Brauer, A Overeem, AH Weerts, R Uijlenhoet | Status: published | Journal: Water Resour. Res. | Volume: 56 | Year: 2020 | doi: 10.1029/2019WR026723
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Modeled Influence of Land Ice and CO2 on Polar Amplification and Paleoclimate Sensitivity During the Past 5 Million Years
Polar amplification and paleoclimate sensitivity (S) have been the subject of many paleoclimate s...
LB Stap, RSW van de Wal, B de Boer, P Kohler, JH Hoencamp, G Lohmann, E Tuenter, LJ Lourens | Status: published | Journal: Paleoceanography | Volume: 33 | Year: 2018 | First page: 381 | Last page: 394 | doi: 10.1002/2017PA003313
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Rainfall Estimation Accuracy of a Nationwide Instantaneously Sampling Commercial Microwave Link Network: Error Dependency on Known Characteristics
Commercial microwave links are installed and maintained for the purpose of telecommunication.
Hyd...
LW de Vos, A Overeem, H Leijnse, R Uijlenhoet | Status: published | Journal: J. Atm. Oceanic Technol. | Volume: 36 | Year: 2019 | First page: 1267 | Last page: 1283 | doi: 10.1175/JTECH-D-18-0197.1
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