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First 1946 results for ” A de Vernal”

  1. Remote Sensing and Analysis of Tropical Cyclones: Current and Emerging Satellite Sensors

    This article describes recent advances in the capability of new satellite sensors for observing T...

    Lucrezia Ricciardulli, Brian Howell, Christopher R. Jackson, Jeff Hawkins, Joe Courtney, Ad Stoffelen, Sebastian Langlade, Chris Fogarty, Alexis Mouche, William Blackwell, Thomas Meissner, Julian Heming, Brett Candy, Tony McNally, Masahiro Kazumori, Chinmay Khadke, Maria Ana Glaiza Escullar | Journal: Tropical Cyclone Research and Review | Year: 2023 | doi: https://doi.org/10.1016/j.tcrr.2023.12.003

    Publication

  2. Soil moisture content retrieval based on apparent thermal inertia for the Xinjiang province in China

    F 7. Veroustraete, Q Li, WW Verstraeten, C Xi, A Bao, Q Dong, T Liu, P Willems | Status: published | Journal: Int. J. of Remote Sens. | Volume: 33 | Year: 2012 | First page: 3870 | Last page: 3885 | doi: http://dx.doi.org/10.1080/01431161.2011.636080

    Publication

  3. The AMSL LST algorithm validated for the Xinjiang Autonomous Region in China

    F Veroustraete, Q Li, WW Verstraeten, X Chen, J Li, T Liu, QH Dong, P Willems | Status: published | Journal: Int. J. of Remote Sens. | Volume: 33 | Year: 2012 | First page: 3886 | Last page: 3905 | doi: http://dx.doi.org/10.1080/01431161.2011.636765

    Publication

  4. Ascat-B ocean calibration and wind product results

    The EUMETSAT Metop-B satellite with onboard the Advanced Scatterometer (ASCAT) has been successfu...

    JA Verspeek, A Stoffelen, A Verhoef, M Portabella, J Vogelzang | Conference: EUMETSAT/AMS | Organisation: EUMETSAT | Place: Wenen | Year: 2013 | First page: 0 | Last page: 0

    Publication

  5. ASCAT SCATTEROMETER OCEAN CALIBRATION

    A new scatterometer, the so-called Advanced scatterometer (ASCAT), onboard MetOp-A satellite was ...

    J Verspeek, A Stoffelen, M Portabella, A Verhoef, J Vogelzang | Conference: International Geoscience and Remote Sensing Symposium (IGARSS) | Organisation: IEEE | Place: Boston, USA | Year: 2008 | First page: 0 | Last page: 0

    Publication