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First 1504 results for ” P Friedlingstein”

1. Performance assessment of geophysical instrumentation through the automated analysis of power spectral density estimates

   This study describes an automated data quality verification procedure supported by a database of ...

   Mathijs Koymans, Jordi Domingo-Ballesta, Elmer Ruigrok, Reinoud Sleeman, Luca Trani, Läslo Evers | Journal: Earth and Space Science | Volume: 8 | Year: 2021 | doi: https://doi.org/10.1029/2021EA001675

   Publication

2. HETEAC – the Hybrid End-To-End Aerosol Classification model for EarthCARE

   The Hybrid End-To-End Aerosol Classification (HETEAC) model for the Earth Clouds, Aerosols and Ra...

   Wandinger, U., Floutsi, A. A., Baars, H., Haarig, M., Ansmann, A., Hünerbein, A., Docter, N., Donovan, D., van Zadelhoff, G.-J., Mason, S., and Cole, J | Journal: Atmospheric Measurement Techniques | Volume: 16 | Year: 2023 | First page: 2485 | Last page: 2510 | doi: 10.5194/amt-16-2485-2023

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3. An intercomparison of EarthCARE cloud, aerosol and precipitation retrieval products

   The mission of the Earth cloud, aerosol and radiation explorer (EarthCARE) mission to observe clo...

   Mason, S. L., Cole, J. N. S., Docter, N., Donovan, D. P., Hogan, R. J., Hünerbein, A., Kollias, P., Puigdomènech Treserras, B., Qu, Z., Wandinger, U., and van Zadelhoff, G.-J | Journal: Atmospheric Measurement Techniques | Volume: 16 | Year: 2023 | doi: 10.5194/egusphere-2023-1682

   Publication

4. Determination of the mixing layer height from ceilometer backscatter profiles

   The mixing layer height (MLH) is a key parameter in studies of many atmospheric boundary layer pr...

   MJ de Haij, H Klein Baltink, WMF Wauben | Journal: KNMI Kenniscentrum | Year: 2010

   Publication

5. Ground-based Observations and Modelling of the Visibility and Radar Reflectivity in a Radiation Fog Layer
   R Boers, H Klein Baltink, J Hemink, F Bosveld, M Moerman | Status: published | Journal: J. Atm. Oceanic Technol. | Volume: 30 | Year: 2013 | First page: 288 | Last page: 300 | doi: 10.1175/JTECH-D-12-00081.1

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