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First 886 results for ” Ran”

1. Downscaling daily air-temperature measurements in the Netherlands

   High-resolution, regularly gridded air-temperature maps are frequently used in climatology, hydro...

   Dirksen, M, W. H. Knap, G.-J. Steenveld, B. Holtslag, A. Klein Tank | Journal: Theoretical and Applied Climatology | Volume: 142 (1) | Year: 2020 | First page: 751 | Last page: 767 | doi: https://doi.org/10.1007/s00704-020-03313-1

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2. Analysis of high frequency photovoltaic solar energy fluctuations

   Characterizing short-term variability of generated solar power is important for the integration o...

   Kreuwel, F. P. M., W. H. Knap, L. R. Visser, W. G. J. H. M. van Sark, J. Vilà-Guerau de Arellano, C. C. van Heerwaarden | Journal: Solar Energy | Volume: 206 | Year: 2020 | First page: 381 | Last page: 389 | doi: https://doi.org/10.1016/j.solener.2020.05.093

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3. Estimating trends and the current climate mean in a changing climate

   Describing the climate evolution using trend lines and estimating the current climate mean (CCM) ...

   Scherrer, S. C., de Valk, C., Begert, M., Gubler, S., Kotlarski, S., & Croci-Maspoli, M. | Journal: Climate Services | Volume: 33 | Year: 2024 | doi: https://doi.org/10.1016/j.cliser.2023.100428

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4. Introduction of the DISAMAR radiative transfer model: determining instrument specifications and analysing methods for atmospheric retrieval (version 4.1.5)

   DISAMAR (determining instrument specifications and analysing methods for atmospheric retrieval) i...

   de Haan, J. F., Wang, P., Sneep, M., Veefkind, J. P., and Stammes, P | Journal: Geoscientific Model Development | Year: 2022 | doi: https://doi.org/10.5194/gmd-15-7031-2022

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5. Internal Wave and Turbulence Observations with Very High-Resolution Temperature Sensors along the Cabauw Mast

   Knowledge about the characteristics of the atmospheric boundary layer is vital for the understand...

   H van Haren and FC Bosveld | Journal: JOURNAL OF ATMOSPHERIC AND OCEANIC TECHNOLOGY | Volume: 39 | Year: 2022 | First page: 1149 | Last page: 1165 | doi: 10.1175/JTECH-D-21-0153.1

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