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First 2203 results for ” Verronen PT”

  1. Evaluation and intercomparison of global atmospheric transport models using 222Rn and other short-lived tracers

    DJ Jacob, MJ Prather, P.J. Rasch, R.L. Shia, YJ Balkanski, S.R. Beagley, DJ Bergmann, W.T. Blackshear, M Brown, M. Chiba, MP Chipperfield, J. de Grandpre, JE Dignon, J. Feichter, C Genthon, W.L. Grose, PS Kasibhatla, I. Kohler, MA Kritz, K. Law, JE Penner, M. Ramonet, CE Reeves, D.A. Rotman, DZ Stockwell, PFJ Van Velthoven, G. Verver, O Wild, H. Yang, P. Zimmermann | Status: published | Journal: J. Geophys. Res. | Volume: 102 | Year: 1997 | First page: 5953 | Last page: 5970

    Publication

  2. Soil moisture content retrieval based on apparent thermal inertia for the Xinjiang province in China

    F 7. Veroustraete, Q Li, WW Verstraeten, C Xi, A Bao, Q Dong, T Liu, P Willems | Status: published | Journal: Int. J. of Remote Sens. | Volume: 33 | Year: 2012 | First page: 3870 | Last page: 3885 | doi: http://dx.doi.org/10.1080/01431161.2011.636080

    Publication

  3. The AMSL LST algorithm validated for the Xinjiang Autonomous Region in China

    F Veroustraete, Q Li, WW Verstraeten, X Chen, J Li, T Liu, QH Dong, P Willems | Status: published | Journal: Int. J. of Remote Sens. | Volume: 33 | Year: 2012 | First page: 3886 | Last page: 3905 | doi: http://dx.doi.org/10.1080/01431161.2011.636765

    Publication

  4. Ascat-B ocean calibration and wind product results

    The EUMETSAT Metop-B satellite with onboard the Advanced Scatterometer (ASCAT) has been successfu...

    JA Verspeek, A Stoffelen, A Verhoef, M Portabella, J Vogelzang | Conference: EUMETSAT/AMS | Organisation: EUMETSAT | Place: Wenen | Year: 2013 | First page: 0 | Last page: 0

    Publication

  5. ASCAT SCATTEROMETER OCEAN CALIBRATION

    A new scatterometer, the so-called Advanced scatterometer (ASCAT), onboard MetOp-A satellite was ...

    J Verspeek, A Stoffelen, M Portabella, A Verhoef, J Vogelzang | Conference: International Geoscience and Remote Sensing Symposium (IGARSS) | Organisation: IEEE | Place: Boston, USA | Year: 2008 | First page: 0 | Last page: 0

    Publication