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First 256 results for ” J Lampel”

  1. LAM and NEDWAM statistics over the period October 1990-April 1991

    LAM and NEDWAM statistics over the period October 1990-April 1991

    R. Van Moerkerken | Year: 1991 | Pages: 77

    Publication

  2. Technical description of LAM and OI: Limited Area Model and Optimum Interpolation analysis

    Technical description of LAM and OI: Limited Area Model and Optimum Interpolation analysis 

    W.C. de Rooy, L.M. Hafkenscheid | Year: 1991 | Pages: 71

    Publication

  3. Intercomparison of MAX-DOAS vertical profile retrieval algorithms: studies on field data from the CINDI-2 campaign

    The second Cabauw Intercomparison of Nitrogen Dioxide measuring Instruments (CINDI-2) took place ...

    Tirpitz, J.-L., Frieß, U., Hendrick, F., Alberti, C., Allaart, M., Apituley, A., Bais, A., Beirle, S., Berkhout, S., Bognar, K., Bösch, T., Bruchkouski, I., Cede, A., Chan, K. L., den Hoed, M., Donner, S., Drosoglou, T., Fayt, C., Friedrich, M. M., Frumau, A., Gast, L., Gielen, C., Gomez-Martín, L., Hao, N., Hensen, A., Henzing, B., Hermans, C., Jin, J., Kreher, K., Kuhn, J., Lampel, J., Li, A., Liu, C., Liu, H., Ma, J., Merlaud, A., Peters, E., Pinardi, G., Piters, A., Platt, U., Puentedura, O., Richter, A., Schmitt, S., Spinei, E., Stein Zweers, D., Strong, K., Swart, D., Tack, F., Tiefengraber, M., van der Hoff, R., van Roozendael, M., Vlemmix, T., Vonk, J., Wagner, T., Wang, Y., Wang, Z., Wenig, M., Wiegner, M., Wittrock, F., Xie, P., Xing, C., Xu, J., Yela, M., Zhang, C., and Zhao, X. | Journal: Atmos. Meas. Tech. | Volume: 14 | Year: 2021 | First page: 1 | Last page: 35 | doi: 10.5194/amt-14-1-2021

    Publication

  4. Three-channel correlation analysis: a new technique to measure instrumental noise of digitizers and seismic sensors

    R Sleeman, A van Wettum, J Trampert | Status: published | Journal: Bulletin of the Seismological Society of America | Volume: 96 | Year: 2006 | First page: 258 | Last page: 271 | doi: 10.1785/0120050032

    Publication

  5. Technical description of LAM and OI: Limited Area Model and Optimum Interpolation analysis, 2nd edition

    Technical description of LAM and OI: Limited Area Model and Optimum Interpolation analysis, 2nd e...

    W.C. de Rooy, L.M. Hafkenscheid | Year: 1992 | Pages: 73

    Publication