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First 115 results for ” M Hamrud”

1. Estimating return periods of extreme events from ECMWF seasonal forecast ensembles

   Meteorological extremes have large impacts on society. The fact that approximately 40% of the Net...

   HW van den Brink, GP Können, JD Opsteegh, GJ van Oldenborgh, G Burgers | Status: published | Journal: Int. J. Climatology | Volume: 25 | Year: 2005 | First page: 1345 | Last page: 1354 | doi: 10.1002/joc.1155

   Publication

2. Evaluation of SEVIRI measurements of high ice water content environments with aircraft data (HAIC Deliverable 32.4)

   A comparison of the MSG-CPP High IWC mask with 2015 Cayenne HAIC field campaign RASTA radar data ...

   ATJ de Laat, JF Meirink | Year: 2017

   Publication

3. Evolution of an Atmospheric Kármán Vortex Street From High‐Resolution Satellite Winds: Guadalupe Island Case Study

   Vortex streets formed in the stratocumulus‐capped wake of mountainous islands are the atmospheri...

   Á. Horváth, W. Bresky, J. Daniels , J. Vogelzang , A. Stoffelen , J.L. Carr, D.L. Wu, C. Seethala, T. Günther, and S.A. Buehler | Journal: Journal of Geophysical Research: Atmospheres | Volume: 125 | Year: 2020 | First page: e2019JD032121 | doi: https://doi.org/10.1029/2019JD032121

   Publication

4. An efficient probabilistic workflow for estimating induced earthquake parameters in 3D heterogeneous media

   We present an efficient probabilistic workflow for the estimation of source parameters of induced...

   La Ode Marzujriban Masfara, Thomas Cullison, Cornelis Weemstra | Journal: Solid Earth | Volume: 13 | Year: 2022 | First page: 1309 | Last page: 1325 | doi: https://doi.org/10.5194/se-13-1309-2022

   Publication

5. Internal Wave and Turbulence Observations with Very High-Resolution Temperature Sensors along the Cabauw Mast

   Knowledge about the characteristics of the atmospheric boundary layer is vital for the understand...

   H van Haren and FC Bosveld | Journal: JOURNAL OF ATMOSPHERIC AND OCEANIC TECHNOLOGY | Volume: 39 | Year: 2022 | First page: 1149 | Last page: 1165 | doi: 10.1175/JTECH-D-21-0153.1

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