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First 1504 results for ” P Friedlingstein”

  1. PARMIO: A Reference Quality Model for Ocean Surface Emissivity and Backscatter from the Microwave to the Infrared

    The need for a community reference quality ocean emission and reflection model for use across a b...

    Emmanuel Dinnat, Stephen English, Catherine Prigent, Lise Kilic, Magdalena Anguelova, Stuart Newman, Thomas Meissner, Jacqueline Boutin, Ad Stoffelen, Simon Yueh, Ben Johnson, Fuzhong Weng , and Carlos Jimenez | Journal: Bulletin of the American Meteorological Society | Year: 2023 | First page: E742 | Last page: E748 | doi: https://doi.org/10.1175/BAMS-D-23-0023.1

    Publication

  2. The CAMS interim Reanalysis of Carbon Monoxide, Ozone and Aerosol for 2003-2015

    A new global reanalysis data set of atmospheric composition (AC) for the period 2003-2015 has bee...

    J Flemming, A Benedetti, A Inness, RJ Engelen, L Jones, V Huijnen, S Remy, M Parrington, M Suttie, A Bozzo, VH Peuch, D Akritidis, E Katragkou | Status: published | Journal: Atm. Chem. Phys. | Year: 2017 | First page: 1945 | Last page: 1983 | doi: 10.5194/acp-17-1945-2017

    Publication

  3. Pathways and pitfalls in extreme event attribution

    The last few years have seen an explosion of interest in extreme event attribution, the science o...

    GJ van Oldenborgh,  K van der Wiel, S Kew, S Philip, F Otto, R Vautard, A King, F Lott, J Arrighi, R Singh, M van Aalst | Journal: Climatic Change | Volume: 166 | Year: 2021 | First page: 13 | doi: 10.1007/s10584-021-03071-7

    Publication

  4. A protocol for probabilistic extreme event attribution analyses

    Over the last few years, methods have been developed to answer questions on the effect of global ...

    SY Philip, SF Kew, GJ van Oldenborgh, FEL Otto, R Vautard, K van der Wiel, A King, F Lott, J Arrighi, R Singh, M van Aalst | Status: published | Journal: Adv. Stat. Clim. Meteorol. Oceanogr. | Volume: 6 | Year: 2020 | First page: 177 | Last page: 203 | doi: https://doi.org/10.5194/ascmo-6-177-2020

    Publication

  5. TROPOMI and TROPI: UV/VIS/NIR/SWIR instruments

    PF Levelt, GHJ van den Oord, M Dobber, H Eskes, M van Weele, JP Veefkind, R van Oss, I Aben, RT Jongma, J Landgraf, J de Vries, J de Vries, H Visser | Journal: SPIE Paper | Year: 2006

    Publication