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First 3716 results for ”Chiem van Straaten”

1. Absorbing Aerosol Index: Sensitivity analysis, application to GOME and comparison with TOMS

   The Absorbing Aerosol Index (AAI) was investigated and used to analyze GOME data and compare it t...

   M de Graaf, P Stammes, O Torres, RBA Koelemeijer | Status: published | Journal: J. Geophys. Res. | Volume: 110 | Year: 2005 | doi: 10.1029/2004JD005178

   Publication

2. Near-term Climate Change: Projections and Predictability
   AD Adedoyin, G Boer, R Bojariu, I Camilloni, FJ Doblas-Reyes, A Fiore, M Kimoto, G Meehl, M Prather, A Sarr, C Schär, R Sutton, GJ van Oldenborgh, G Vecchi, HJ Wang | Year: 2013

   Publication

3. Scientific Developments and the EPS-SG Scatterometer

   The second-generation exploitation of meteorological satellite polar system (EPS-SG) C-band-wavel...

   Ad Stoffelen, Signe Aaboe, Jean-Christophe Calvet, James Cotton, Giovanna De Chiara, Julia Figa Saldana, Alexis Aurélien Mouche, Marcos Portabella, Klaus Scipal, Wolfgang Wagner | Journal: IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing | Year: 2017 | doi: https://doi.org/10.1109/JSTARS.2017.2696424

   Publication

4. Observations from Personal Weather Stations—EUMETNET Interests and Experience

   The number of people owning a private weather station (PWS) and sharing their meteorological meas...

   Claudia Hahn, Irene Garcia-Marti, Jacqueline Sugier, Fiona Emsley, Anne-Lise Beaulant, Louise Oram, Eva Strandberg, Elisa Lindgren, Martyn Sunter, Franziska Ziska | Journal: MDPI CLimate | Volume: 10 | Year: 2022 | doi: https://doi.org/10.3390/cli10120192

   Publication

5. Statistical Quality Control of High-Resolution Winds of Different Radiosonde Types for Climatology Analysis

   Quality control (QC) is among the most important steps in any data processing. These steps are el...

   K Houchi, A Stoffelen, GJ Marseille, J de Kloe | Status: published | Journal: J. Atm. Oceanic Technol. | Volume: 32 | Year: 2015 | First page: 1796 | Last page: 1812 | doi: DOI: 10.1175/JTECH-D-14-00160.1

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