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First 242 results for ” Little”

1. Towards a high-resolution gridded ocean forcing

   Scatterometers estimate the relative atmosphere-ocean motion at spatially high resolution and pro...

   M Portabella, A Stoffelen, A Verhoef, J Verspeek, J Vogelzang | Conference: EUMETSAT/AMS conference | Organisation: EUMETSAT | Place: Amsterdam, The Netherlands | Year: 2007 | First page: 0 | Last page: 0

   Publication

2. Evaluation of atmospheric fields from the ECMWF seasonal forecasts over a 15 year period

   Since 1997 the European Centre for Medium-Range Weather Forecasts (ECMWF) has made seasonal forec...

   GJ van Oldenborgh, MA Balmaseda, L Ferranti, TN Stockdale, DLT Anderson | Status: published | Journal: J. Climate | Volume: 18 | Year: 2005 | First page: 5188 | Last page: 5198

   Publication

3. Impact of model resolution on tropical cyclone simulation using the HighResMIP-PRIMAVERA multimodel ensemble

   A multimodel, multiresolution set of simulations over the period 1950–2014 using a common forcing...

   MJ Roberts, J Camp, J Seddon, PL Vidale, K Hodges, B Vanniere, J Mecking, RJ Haarsma, A Bellucci, E Scoccimarro, LP Caron, F Chauvin, L Terray, S Valcke, MP Moine | Status: published | Journal: J. Climate | Year: 2020 | doi: 10.1175/JCLI-D-19-0639.1

   Publication

4. Future changes in atmospheric rivers and extreme precipitation in Norway

   Flooding events associated with extreme precipitation have had large impacts in Norway. It is wel...

   K Whan, J Sillmann, N Schaller, R Haarsma | Status: published | Journal: Clim. Dyn. | Year: 2020 | doi: https://doi.org/10.1007/s00382-019-05099-z

   Publication

5. Full-year evaluation of nonmeteorological echo removal with dual-polarization fuzzy logic for two C-band radars in a temperate climate

   The Royal Netherlands Meteorological Institute (KNMI) operates two dual-polarization C-band weath...

   A Overeem, R Uijlenhoet, H Leijnse | Status: published | Journal: J. Atm. Oceanic Technol. | Volume: 37 | Year: 2020 | First page: 1643 | Last page: 1660 | doi: 10.1175/JTECH-D-19-0149.1

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