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First 375 results for ” MT Woodhouse”

1. A single-column model intercomparison of a heavily drizzling stratocumulus topped boundary layer

   This study presents an intercomparison of single-column model simulations of a nocturnal heavily ...

   MC Wyant, CS Bretherton, A Chlond, BM Griffin, H Kitagawa, CL Lappen, VE Larson, A Lock, S Park, SR de Roode, M Zhao, AS Ackerman | Status: published | Journal: J. Geophys. Res. | Volume: 112 | Year: 2007 | doi: 10.1029/2007JD008536

   Publication

2. A single-column model intercomparison on the stratocumulus representation in present-day and future climate

   Six Single-Column Model (SCM) versions of climate models are evaluated on the basis of their repr...

   S Dal Gesso, JJ van der Dussen, AP Siebesma, SR de Roode, IA Boutle, Y Kamae, R Roehrig, J Vial | Status: published | Journal: J. of Advances in Modeling Earth Systems | Volume: 7 | Year: 2015 | First page: 617 | Last page: 647 | doi: 10.1002/2014MS000377

   Publication

3. Is the decline of the AMOC responsible for the warming hole above the North Atlantic in the 20th century warming pattern?
   SS Drijfhout, GJ van Oldenborgh, AA Cimatoribus | Status: published | Journal: J. Climate | Volume: 25 | Year: 2012 | First page: 8373 | Last page: 8379 | doi: 10.1175/JCLI-D-12-00490.1

   Publication

4. A realistic freshwater forcing protocol for ocean-coupled climate models

   A high-end scenario of polar ice loss from the Greenland and Antarctic ice sheet is presented wit...

   J van den Berk, SS Drijfhout | Status: published | Journal: Ocean Mod. | Volume: 81 | Year: 2014 | First page: 36 | Last page: 48 | doi: doi:10.1016/j.ocemod.2014.07.003

   Publication

5. Statistical Quality Control of High-Resolution Winds of Different Radiosonde Types for Climatology Analysis

   Quality control (QC) is among the most important steps in any data processing. These steps are el...

   K Houchi, A Stoffelen, GJ Marseille, J de Kloe | Status: published | Journal: J. Atm. Oceanic Technol. | Volume: 32 | Year: 2015 | First page: 1796 | Last page: 1812 | doi: DOI: 10.1175/JTECH-D-14-00160.1

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