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First 215 results for ” RM Nadeau”

1. Algorithm theoretical baseline for formaldehyde retrievals from S5P TROPOMI and from the QA4ECV project

   On board the Copernicus Sentinel-5 Precursor (S5P) platform, the TROPOspheric Monitoring Instrume...

   I De Smedt, N Theys, H Yu, T Danckaert, C Lerot, S Compernolle, M Van Roozendael1, A Richter, A Hilboll, E Peters, M Pedergnana, D Loyola, S Beirle, T Wagner, HJ Eskes, JHG van Geffen, KF Boersma, JP Veefkind | Status: published | Journal: Atmospheric Measurement Techniques | Volume: 11 | Year: 2018 | First page: 2395 | Last page: 2426 | doi: 10.5194/amt-11-2395-2018

   Publication

2. Nine years of atmospheric remote sensing with SCIAMACHY - atmospheric parameters and data products

   The SCIAMACHY instrument on-board ENVISAT measures since 2002 trace gas constituents of the atmos...

   G Lichtenberg, .........., LG Tilstra, T Fehr | Conference: 2011 IEEE International Geoscience & Remote Sensing Symposium (IGARSS) | Organisation: IGARSS | Place: Vancouver, BC, Canada | Year: 2011 | First page: 3680 | Last page: 3683

   Publication

3. A generalized simulation capability for rotating- beam scatterometers

   Rotating-beam wind scatterometers exist in two types: rotating fan-beam and rotating pencil-beam...

   Zhen Li, Ad Stoffelen, Anton Verhoef | Journal: Atmos. Meas. Tech. | Volume: 12 | Year: 2019 | First page: 3573 | Last page: 3594 | doi: https://doi.org/10.5194/amt-12-3573-2019

   Publication

4. Stadstemperatuur in beeld met smartphones

   Nauwkeurige observaties van luchttemperaturen zijn belangrijk voor de meteorologie. Ze zijn onmis...

   A Overeem, JCR Robinson, H Leijnse, GJ Steeneveld, BKP Horn, R Uijlenhoet | Journal: Meteorologica | Volume: 23 | Year: 2014 | First page: 16 | Last page: 18

   Publication

5. Large-scale validation of SCIAMACHY reflectance in the ultraviolet

   In this paper we present an extensive validation of calibrated SCIAMACHY nadir reflectance in the...

   G van Soest, LG Tilstra, P Stammes | Status: published | Journal: Atm. Chem. Phys. | Volume: 5 | Year: 2005 | First page: 2171 | Last page: 2180 | doi: 1680-7324/acp/2005-5-2171

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