Search results

Verberg filters
Sort by
Types
Publication types
Publication year
t/m
Toon filters

First 574 results for ” P Killworth”

  1. De betekenis van de veranderlijkheid van de windrichting voor schattingen van de ligging van het besmette gebied na ongevallen met schadelijke stoffen

    De betekenis van de veranderlijkheid van de windrichting voor schattingen van de ligging van het ...

    W.N. Lablans en P.J. Rijkoort | Year: 1974 | Pages: 21

    Publication

  2. Tien jaar Baseline Surface Radiationpdf Network (BSRN) in Cabauw

    Langdurig meten kan spannende zaken aan het licht brengen. Zaken die we op voorhand niet wisten o...

    Knap, W. H. and C. van Oort | Journal: Meteorologica | Volume: 2 | Year: 2015 | First page: 20 | Last page: 23

    Publication

  3. Characterization of Aeolus Measurement Errors by Triple Collocation Analysis Over Western Europe

    The resolution of regional numerical weather prediction (NWP) models has continuously been increa...

    Federico Cossu, Marcos Portabella, Wenming Lin, Ad Stoffelen, Jur Vogelzang, Gert-Jan Marseille, Siebren de Haan | Journal: IGARSS 2022 - 2022 IEEE International Geoscience and Remote Sensing Symposium | Year: 2022 | doi: https://doi.org/10.1109/IGARSS46834.2022.9883249

    Publication

  4. Recent changes in climate extremes in the Caribbean region

    TC Peterson, M.A. Taylor, R Demeritte, D.L. Duncombe, S Burton, F. Thompson, A Porter, M. Mercedes, E Villegas, R Semexant Fils, AMG Klein Tank, R. Warner, A Joyette, W. Mills, L Alexander, B Gleason | Status: published | Journal: J. Geophys. Res. | Year: 2002 | First page: 4601 | doi: doi:10.1029/2002JD002251

    Publication

  5. Statistical Quality Control of High-Resolution Winds of Different Radiosonde Types for Climatology Analysis

    Quality control (QC) is among the most important steps in any data processing. These steps are el...

    K Houchi, A Stoffelen, GJ Marseille, J de Kloe | Status: published | Journal: J. Atm. Oceanic Technol. | Volume: 32 | Year: 2015 | First page: 1796 | Last page: 1812 | doi: DOI: 10.1175/JTECH-D-14-00160.1

    Publication