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First 2154 results for ” Vartika Singh”

1. Modeling and simulating spatial extremes by combining extreme value theory with generative adversarial networks

   Modeling dependencies between climate extremes is important for climate risk assessment, for inst...

   Y Boulaguiem, J Zschleischler, E Vignotto, K van der Wiel, S Engelke | Journal: Environmental Data Science | Volume: 1 | Year: 2022 | First page: e5 | doi: 10.1017/eds.2022.4

   Publication

2. Ocean signatures in the total flux and polarization spectra of Earth-like exoplanets

   Context. Numerical simulations of starlight that is reflected by Earth-like exoplanets predict ha...

   Trees, V.J.H. and Stam, D.M | Journal: Astronomy & Astrophysics | Year: 2022 | doi: https://doi.org/10.1051/0004-6361/202243591

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3. Spatiotemporal changes in aerosols over Bangladesh using 18 years of MODIS and Reanalyses data.

   In this study, combined Dark Target and Deep Blue (DTB) aerosol optical depth at 550 nm (AOD550 n...

   Ali, M.A. Bilal, M., Wang, Y., Qiu, Z., Nichol, J.E., Mhawish, A., de Leeuw, G., Zhang, Y., Shahid, S., Almazroui, M., Islam, M.N., Rahman, M.A., Mondol, S.K., Tiwari, P., Khedher, K.M. | Journal: Journal of Environmental Management | Volume: 35 | Year: 2022 | First page: 115097 | doi: https://doi.org/10.1016/j.jenvman.2022.115097

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4. Analysis of Data-Derived SeaWinds Normalized Radar Cross-Section Noise

   The normalized standard deviation (Kp) of the noise that affects scatterometer Normalized Radar C...

   Giuseppe Grieco, Ad Stoffelen, Anton Verhoef, Jur Vogelzang, Marcos Portabella | Journal: Remote Sensing | Volume: 14 | Year: 2022 | doi: https://doi.org/10.3390/rs14215444

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5. Internal Wave and Turbulence Observations with Very High-Resolution Temperature Sensors along the Cabauw Mast

   Knowledge about the characteristics of the atmospheric boundary layer is vital for the understand...

   H van Haren and FC Bosveld | Journal: JOURNAL OF ATMOSPHERIC AND OCEANIC TECHNOLOGY | Volume: 39 | Year: 2022 | First page: 1149 | Last page: 1165 | doi: 10.1175/JTECH-D-21-0153.1

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