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First 688 results for ” M Seifert”

  1. Analysemethoden en frontenstructuur :synoptisch De Bilt, 15 en 29 november 1978

    Analysemethoden en frontenstructuur :synoptisch De Bilt, 15 en 29 november 1978

    L.M. Hafkenscheid, J.H.A. Bernard, H.R.A. Wessels, J. Reiff, M.J.M. Saraber | Year: 1979 | Pages: 59

    Publication

  2. Het gebruik van trajektoriën bij een korte termijn verwachting

    Het gebruik van trajektoriën bij een korte termijn verwachting 

    P.W. Rosier, J. Reiff, C.J. van der Goot, A. Steenhuisen | Year: 1983 | Pages: 36

    Publication

  3. Detecting Clouds Associated with Jet Engine Ice Crystal Icing

    In the past two decades over 150 jet engine power-loss and damage events have been attributed to ...

    J Haggerty, E Defer, ATJ de Laat, K Bedka, JM Moisselin, J Delanoe, F Parol, A Grandin, S Devito | Status: published | Journal: Bull. Amer. Meteor. Soc. | Volume: 1 | Year: 2019 | First page: 31 | Last page: 40 | doi: https://doi.org/10.1175/BAMS-D-17-0252.1

    Publication

  4. European daily precipitation according to EURO-CORDEX regional climate models (RCMs) and high-resolution global climate models (GCMs) from the High-Resolution Model Intercomparison Project (HighResMIP)

    In this study, we evaluate a set of high-resolution (25-50 km horizontal grid spacing) global cli...

    ME Demory, S Berthou, J Fernandez, S Soerland, R Brogli, MJ Roberts, U Beyerle, J Seddon, RJ Haarsma, C Schar, E Buonomo, OB Christensen, JM Ciarlo, R Fealy, C Nikulin | Status: published | Journal: Geoscientific Model Development | Year: 2020 | doi: 10.5194/gmd-13-5485-2020

    Publication

  5. Statistical Quality Control of High-Resolution Winds of Different Radiosonde Types for Climatology Analysis

    Quality control (QC) is among the most important steps in any data processing. These steps are el...

    K Houchi, A Stoffelen, GJ Marseille, J de Kloe | Status: published | Journal: J. Atm. Oceanic Technol. | Volume: 32 | Year: 2015 | First page: 1796 | Last page: 1812 | doi: DOI: 10.1175/JTECH-D-14-00160.1

    Publication