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First 306 results for ” DS Hamilton”

1. Pathfinder: Applying graph theory for consistent tracking of daytime mixed layer height with backscatter lidar

   The height of the atmospheric boundary layer or mixing layer is an important parameter for unders...

   M de Bruine, A Apituley, , DP Donovan, H Klein Baltink | Status: submitted | Journal: Atmospheric Measurement Techniques | Year: 2017 | doi: doi:10.5194/amt-2016-327

   Publication

2. Estimating return periods of extreme events from ECMWF seasonal forecast ensembles

   Meteorological extremes have large impacts on society. The fact that approximately 40% of the Net...

   HW van den Brink, GP Können, JD Opsteegh, GJ van Oldenborgh, G Burgers | Status: published | Journal: Int. J. Climatology | Volume: 25 | Year: 2005 | First page: 1345 | Last page: 1354 | doi: 10.1002/joc.1155

   Publication

3. Evaluation of SEVIRI measurements of high ice water content environments with aircraft data (HAIC Deliverable 32.4)

   A comparison of the MSG-CPP High IWC mask with 2015 Cayenne HAIC field campaign RASTA radar data ...

   ATJ de Laat, JF Meirink | Year: 2017

   Publication

4. Evolution of an Atmospheric Kármán Vortex Street From High‐Resolution Satellite Winds: Guadalupe Island Case Study

   Vortex streets formed in the stratocumulus‐capped wake of mountainous islands are the atmospheri...

   Á. Horváth, W. Bresky, J. Daniels , J. Vogelzang , A. Stoffelen , J.L. Carr, D.L. Wu, C. Seethala, T. Günther, and S.A. Buehler | Journal: Journal of Geophysical Research: Atmospheres | Volume: 125 | Year: 2020 | First page: e2019JD032121 | doi: https://doi.org/10.1029/2019JD032121

   Publication

5. Internal Wave and Turbulence Observations with Very High-Resolution Temperature Sensors along the Cabauw Mast

   Knowledge about the characteristics of the atmospheric boundary layer is vital for the understand...

   H van Haren and FC Bosveld | Journal: JOURNAL OF ATMOSPHERIC AND OCEANIC TECHNOLOGY | Volume: 39 | Year: 2022 | First page: 1149 | Last page: 1165 | doi: 10.1175/JTECH-D-21-0153.1

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