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Model-based estimation of sampling-caused uncertainty in aerosol remote sensing for climate research applications
To evaluate the effect of sampling frequency on the global monthly mean aerosol optical thickness...
I Geogdzhayev, B Cairns, MI Mishchenko, K Tsigaridis, T van Noije | Status: published | Journal: Q.J.R. Meteorol. Soc. | Volume: 140 | Year: 2013 | First page: 2353 | Last page: 2363 | doi: 10.1002/qj.2305
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Rapid attribution of the August 2016 flood-inducing extreme precipitation in south Louisiana to climate change
A stationary low pressure system and elevated levels of precipitable water provided a nearly cont...
K van der Wiel, SB Kapnick, GJ van Oldenborgh, K Whan, S Philip, GA Vecchi, RK Singh, J Arrighi, H Cullen | Status: published | Journal: Hydrology and Earth System Sciences | Volume: 21 | Year: 2017 | First page: 897 | Last page: 921 | doi: 10.5194/hess-21-897-2017
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Aerosols in the convective boundary layer: shortwave radiation effects on the coupled land-atmosphere system
By combining observations and numerical simulations, we investigated the responses of the surface...
E Barbaro, JVG de Arellano, HG Ouwersloot, JS Schröter, DP Donovan, MC Krol | Status: published | Journal: J. Geophys. Res. | Volume: 119 | Year: 2014 | First page: 5845 | Last page: 5863 | doi: doi:10.1002/2013JD021237
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Microphysical properties of cirrus clouds as derived from CloudSat/CALIPSO
Through their interaction with solar and thermal radiation, ice clouds are important in determini...
E Boesche, GJ van Zadelhoff, DP Donovan | Conference: 8th ISTP | Organisation: Delft/KNMI/RIVM | Place: Delft | Year: 2009 | First page: 0 | Last page: 0
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Statistical Quality Control of High-Resolution Winds of Different Radiosonde Types for Climatology Analysis
Quality control (QC) is among the most important steps in any data processing. These steps are el...
K Houchi, A Stoffelen, GJ Marseille, J de Kloe | Status: published | Journal: J. Atm. Oceanic Technol. | Volume: 32 | Year: 2015 | First page: 1796 | Last page: 1812 | doi: DOI: 10.1175/JTECH-D-14-00160.1
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