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First 4114 results for ” JD Assink and PSM Smets”

1. In-flight performance of the Ozone Monitoring Instrument

   The Dutch–Finnish Ozone Monitoring Instrument (OMI) is an imaging spectrograph flying on NASA's E...

   Schenkeveld, V. M. E.; Jaross, G.; Marchenko, S.; Haffner, D.; Kleipool, Q. L.; Rozemeijer, N. C.; Veefkind, J. P.; Levelt, P. F. | Journal: Atmospheric Measurement Techniques | Year: 2017 | doi: https://doi.org/10.5194/amt-10-1957-2017

   Publication

2. Microphysical process of a cold vortex during its movement to the east – A case study

   A cold vortex is an important weather system that can cause low temperatures and large amounts of...

   Y Li, W Wang, X Qin, G de Leeuw | Status: published | Journal: Atmosphere | Volume: 11 | Year: 2020 | First page: 1 | Last page: 19 | doi: doi:10.3390/atmos11101083

   Publication

3. From proof-of-concept to proof-of-value: Approaching third-party data to operational workflows of national meteorological services

   National meteorological services (NMS) are limited by practical and financial boundaries in the n...

   Irene Garcia-Marti Aart Overeem Jan Willem Noteboom Lotte de Vos Marijn de Haij Kirien Whan | Journal: International Journal of Climatology | Year: 2022 | First page: 1 | Last page: 18 | doi: 10.1002/joc.7757

   Publication

4. Evaluation of SCIAMACHY Level-1 data versions using nadir ozone profile retrievals in the period 2003–2011,

   Ozone profile retrieval from nadir-viewing satellite instruments operating in the ultraviolet–vis...

   S. Shah O.N.E. Tuinder J. van Peet P. Stammes A.T.J. de Laat | Journal: Atmospheric Measurement Techniques | Volume: 11 | Year: 2018 | First page: 2345 | Last page: 2360 | doi: 10.5194/amt-11-2345-2018

   Publication

5. ASCAT SCATTEROMETER OCEAN CALIBRATION

   A new scatterometer, the so-called Advanced scatterometer (ASCAT), onboard MetOp-A satellite was ...

   J Verspeek, A Stoffelen, M Portabella, A Verhoef, J Vogelzang | Conference: International Geoscience and Remote Sensing Symposium (IGARSS) | Organisation: IEEE | Place: Boston, USA | Year: 2008 | First page: 0 | Last page: 0

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