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First 3456 results for ”Leon van Voorst en Henk van den Brink”

  1. Systematic aerosol characterization by combining UV aerosol indices with trace gas concentrations

    Knowledge of aerosol type or source is of importance for the calculation of aerosol radiative eff...

    MJM Penning de Vries, S Beirle, C Hörmann, JW Kaiser, LG Tilstra, ONE Tuinder, P Stammes, T Wagner | Conference: 2014 EUMETSAT Meteorological Satellite Conference | Organisation: EUMETSAT | Place: Geneva, Switzerland | Year: 2014 | First page: 0 | Last page: 0

    Publication

  2. Modeling global impacts of heterogeneous loss of HO2 on cloud droplets, ice particles and aerosols

    The abundance and spatial variability of the hydroperoxyl radical (HO2) in the troposphere strong...

    V Huijnen, JE Williams, J Flemming | Status: submitted | Journal: Atm. Chem. Phys. | Year: 2014 | First page: 8575 | Last page: 8632 | doi: doi:10.5194/acpd-14-8575-2014

    Publication

  3. Sea surface height variability in the North East Atlantic from satellite altimetry

    Data from 21 years of satellite altimeter measurements are used to identify and understand the ma...

    P Sterlini, et al. | Status: published | Journal: Clim. Dyn. | Year: 2015 | doi: DOI 10.1007/s00382-015-2901-x

    Publication

  4. Statistical Quality Control of High-Resolution Winds of Different Radiosonde Types for Climatology Analysis

    Quality control (QC) is among the most important steps in any data processing. These steps are el...

    K Houchi, A Stoffelen, GJ Marseille, J de Kloe | Status: published | Journal: J. Atm. Oceanic Technol. | Volume: 32 | Year: 2015 | First page: 1796 | Last page: 1812 | doi: DOI: 10.1175/JTECH-D-14-00160.1

    Publication

  5. Validation of two-dimensional variational ambiguity removal on SeaWinds scatterometer data

    Wind scatterometry is an important technique for retrieving high-resolution near-surface wind inf...

    J Vogelzang, A Stoffelen, A Verhoef, J de Vries, H Bonekamp | Status: published | Journal: J. Atm. Oceanic Technol. | Volume: 26 | Year: 2009 | First page: 1229 | Last page: 1245 | doi: 10.1175/2008JTECHA1232.1

    Publication