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Combined UV and IR ozone profile retrieval from TROPOMI and CrIS measurements
Vertical ozone profiles from combined spectral measurements in the ultraviolet and infrared spect...
Mettig, N., Weber, M., Rozanov, A., Burrows, J. P., Veefkind, P., Thompson, A. M., Stauffer, R. M., Leblanc, T., Ancellet, G., Newchurch, M. J., Kuang, S., Kivi, R., Tully, M. B., Van Malderen, R., Piters, A., Kois, B., Stübi, R., and Skrivankova, P. | Journal: Atmos. Meas. Tech. | Volume: 15 | Year: 2022 | First page: 2955 | Last page: 2978 | doi: 10.5194/amt-15-2955-2022
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TEMIS UV product validation using NILU-UV ground-based measurements in Thessaloniki, Greece
This study aims to cross-validate ground-based and satellite-based models of three photobiologica...
Zempila, M.M., Van Geffen, J.H.G.M., Taylor, M., Fountoulakis, I., Koukouli, M.E., Van Weele, M., Van der A, R.J., Bais, A., Meleti, C. and Balis, D | Journal: Atmospheric Chemistry and Physics | Year: 2017 | doi: https://doi.org/10.5194/acp-17-7157-2017
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A directional surface reflectance climatology determined from TROPOMI observations
In this paper, we introduce a spectral surface reflectivity climatology based on observations mad...
L.G. Tilstra, M. de Graaf, V.J.H. Trees, P. Litvinov, O. Dubovik, P. Stammes | Journal: Atmospheric Measurement Techniques | Volume: 17 | Year: 2024 | First page: 2235 | Last page: 2256 | doi: 10.5194/amt-17-2235-2024
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Evaluation of the operational Aerosol Layer Height retrieval algorithm for Sentinel-5 Precursor
An algorithm setup for the operational Aerosol Layer Height product for TROPOMI on the Sentinel-5...
AJ Sanders, JF de Haan, M Sneep, A Apituley, P Stammes, MO Vieitez, LG Tilstra, ONE Tuinder, CE Koning, JP Veefkind | Status: published | Journal: Atmospheric Measurement Techniques | Volume: 8 | Year: 2015 | First page: 6045 | Last page: 6118 | doi: doi:10.5194/amtd-8-6045-2015
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ASCAT SCATTEROMETER OCEAN CALIBRATION
A new scatterometer, the so-called Advanced scatterometer (ASCAT), onboard MetOp-A satellite was ...
J Verspeek, A Stoffelen, M Portabella, A Verhoef, J Vogelzang | Conference: International Geoscience and Remote Sensing Symposium (IGARSS) | Organisation: IEEE | Place: Boston, USA | Year: 2008 | First page: 0 | Last page: 0
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