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First 758 results for ” K. Odemark”

  1. Exploring high-end climate change scenarios for flood protection of the Netherlands

    This international scientific assessment has been carried out at the request of the Dutch Delta C...

    Pier Vellinga, Caroline Katsman, Andreas Sterl, Jules Beersma, Wilco Hazeleger, John Church, Robert Kopp, Dick Kroon, Michael Oppenheimer, Hans-Peter Plag, Stefan Rahmstorf, Jason Lowe, Jeff Ridley, Hans von Storch, David Vaughan, Roderik van de Wal, Ralf Weisse, Jaap Kwadijk, Rita Lammersen, Natasha Marinova | Year: 2009 | Pages: 144

    Publication

  2. Multi-model ensemble analysis of the ETEX-2 experiment

    S Potemski, S Galmarini, R Addis, Astrup, Bader, Bellasio, R Bianconi, F Bonnardot, R Buckley, R D\'Amours, A van Dijk, G Geertsema, A Jones, P Kaufmann, U Pechinger, C Persson, E. Polreich, , M Prodanova, L. Robertson, J Soernsen, D. Dyrakov | Status: accepted | Journal: Atmos. Environm. | Year: 2008

    Publication

  3. Data assimilation of surface air pollutants (O3 and NO2) in the regional-scale air quality model AURORA

    In the present work, a bias-aware optimal interpolation in conjunction with the Hollingsworthe Lö...

    U Kumar, K De Ridder, W Lefebvre, S Janssen | Status: published | Journal: Atmos. Environm. | Volume: 46 | Year: 2012 | First page: 99 | Last page: 108 | doi: 10.1016/j.atmosenv.2012.06.005

    Publication

  4. Impact of HARMONIE high-resolution meteorological forecasts on the air quality simulations of LOTOS-EUROS

    In this study, we couple the LOTOS-EUROS model with high resolution meteorological forecasts from...

    J Ding, HJ Eskes, U Kumar, M Krol | Year: 2013 | Pages: 46

    Publication

  5. Statistical Quality Control of High-Resolution Winds of Different Radiosonde Types for Climatology Analysis

    Quality control (QC) is among the most important steps in any data processing. These steps are el...

    K Houchi, A Stoffelen, GJ Marseille, J de Kloe | Status: published | Journal: J. Atm. Oceanic Technol. | Volume: 32 | Year: 2015 | First page: 1796 | Last page: 1812 | doi: DOI: 10.1175/JTECH-D-14-00160.1

    Publication