E Laan, J de Vries, H Visser, PF Levelt, GHJ van den Oord, A Mälkki, G Leppelmeier, E Hilsenrath. Ozone Monitoring with the OMI Instrument
Conference: SPIE 45th Annual Meeting - The International Symposium on Optical Science and Technology, Place: San Diego, Year: 2000, First page: 334, Last page: 343