Search results

Verberg filters
Sort by
Types
Publication types
Publication year
t/m
Toon filters

First 434 results for ” M Riese”

  1. Systematic aerosol characterization by combining UV aerosol indices with trace gas concentrations

    Knowledge of aerosol type or source is of importance for the calculation of aerosol radiative eff...

    MJM Penning de Vries, S Beirle, C Hörmann, JW Kaiser, LG Tilstra, ONE Tuinder, P Stammes, T Wagner | Conference: 2014 EUMETSAT Meteorological Satellite Conference | Organisation: EUMETSAT | Place: Geneva, Switzerland | Year: 2014 | First page: 0 | Last page: 0

    Publication

  2. A global aerosol classification algorithm incorporating multiple satellite data sets of aerosol and trace gas abundances

    Detecting the optical properties of aerosols using passive satellite-borne measurements alone is ...

    MJM Penning de Vries, S Beirle, C Hörmann, JW Kaiser, P Stammes, LG Tilstra, ONE Tuinder, T Wagner | Status: published | Journal: Atm. Chem. Phys. | Volume: 15 | Year: 2015 | First page: 10597 | Last page: 10618 | doi: 10.5194/acp-15-10597-2015

    Publication

  3. On-gound calibration of the ozone monitoring instrument from scientific point of view

    R Dirksen, M Dobber, PF Levelt, G van den Oord, G Jaross, M Kowalewski, GH Mount, DH Heath, E Hilsenrath, J de Vries | Conference: SPIE conference | Organisation: SPIE | Place: Barcelona | Year: 2004 | First page: 400 | Last page: 410

    Publication

  4. Validation of Sciamachy ozone column densities and profiles using groundbased FTIR and millimeter wave measurements

    G Kopp, T Blumenstock, EJ Brinksma, H Eskes, A Griesfeller, F Hase, G Hochschild, I Kramer, S Mikuteit, U Raffalski, RJ van der A | Conference: Second workshop on the Atmospheric Chemistry Validation of Envisat (ACVE-2) SP-562 | Organisation: ESRIN | Place: Frascati | Year: 2004 | First page: 0 | Last page: 0

    Publication

  5. Ozone Monitoring with the OMI Instrument

    E Laan, J de Vries, H Visser, PF Levelt, GHJ van den Oord, A Mälkki, G Leppelmeier, E Hilsenrath | Conference: SPIE 45th Annual Meeting - The International Symposium on Optical Science and Technology | Place: San Diego | Year: 2000 | First page: 334 | Last page: 343

    Publication