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First 780 results for ”R.J.M. IJpelaar”

  1. Beschrijving en toepassingsmogelijkheden van gemiddelde topografieën van het 500 mbar vlak in afhankelijkheid van circulatietypen

    Beschrijving en toepassingsmogelijkheden van gemiddelde topografieën van het 500 mbar vlak in afh...

    W. van Dijk, F.H. Schmidt en C.J.E. Schuurmans | Year: 1974 | Pages: 162

    Publication

  2. Weertypeklimatologie voor De Bilt, 1881-1970

    Weertypeklimatologie voor De Bilt, 1881-1970

    C.J.E. Schuurmans en H.J. Krijnen 1971 | Year: 1971 | Pages: 69

    Publication

  3. Ocean signatures in the total flux and polarization spectra of Earth-like exoplanets

    Context. Numerical simulations of starlight that is reflected by Earth-like exoplanets predict ha...

    Trees, V.J.H. and Stam, D.M | Journal: Astronomy & Astrophysics | Year: 2022 | doi: https://doi.org/10.1051/0004-6361/202243591

    Publication

  4. Tropospheric emissions: Monitoring of pollution (TEMPO)

    TEMPO was selected in 2012 by NASA as the first Earth Venture Instrument, for launch between 2018...

    Zoogman, P.; Liu, X.; Suleiman, R.M.; Pennington, W.F.; Flittner, D.E.; Al-Saadi, J.A.; Hilton, B.B.; Nicks, D.K.; Newchurch, M.J.; Carr, J.L.; Janz, S.J.; Andraschko, M.R.; Arola, A.; Baker, B.D.; Canova, B.P.; Chan Miller, C.; Cohen, R.C.; Davis, J.E.; Dussault, M.E.; Edwards, D.P.; Fishman, J.; Ghulam, A.; González Abad, G.; Grutter, M.; Herman, J.R.; Houck, J.; Jacob, D.J.; Joiner, J.; Kerridge, B.J.; Kim, J.; Krotkov, N.A.; Lamsal, L.; Li, C.; Lindfors, A.; Martin, R.V.; McElroy, C.T.; McLinden, C.; Natraj, V.; Neil, D.O.; Nowlan, C.R.; O׳Sullivan, E.J.; Palmer, P.I.; Pierce, R.B.; Pippin, M.R.; Saiz-Lopez, A.; Spurr, R.J.D.; Szykman, J.J.; Torres, O.; Veefkind, J.P.; Veihelmann, B.; Wang, H.; Wang, J.; Chance, K. | Journal: Satellite Remote Sensing and Spectroscopy: Joint ACE-Odin Meeting, October 2015 | Year: 2017 | doi: https://doi.org/10.1016/j.jqsrt.2016.05.008

    Publication

  5. Ozone Monitoring with the OMI Instrument

    E Laan, J de Vries, H Visser, PF Levelt, GHJ van den Oord, A Mälkki, G Leppelmeier, E Hilsenrath | Conference: SPIE 45th Annual Meeting - The International Symposium on Optical Science and Technology | Place: San Diego | Year: 2000 | First page: 334 | Last page: 343

    Publication